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Metal Impurities in Silicon- and Germanium-Based Technologies

Overview of attention for book
Attention for Chapter 9: Modeling of Metal Properties in Si, Si 1− x Ge x and Ge
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Chapter title
Modeling of Metal Properties in Si, Si 1− x Ge x and Ge
Chapter number 9
Book title
Metal Impurities in Silicon- and Germanium-Based Technologies
Published by
Springer, Cham, January 2018
DOI 10.1007/978-3-319-93925-4_9
Book ISBNs
978-3-31-993924-7, 978-3-31-993925-4
Authors

Cor Claeys, Eddy Simoen, Claeys, Cor, Simoen, Eddy

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 1 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 1 100%
Readers by discipline Count As %
Physics and Astronomy 1 100%