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How Optical CMMs and 3D Scanning Will Revolutionize the 3D Metrology World
Integrated Imaging and Vision Techniques for Industrial Inspection
Springer, London, January 2015
Jean-Francois Larue, Daniel Brown, Marc Viala
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||1||50%|
|Student > Master||1||50%|
|Readers by discipline||Count||As %|