↓ Skip to main content

Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources

Overview of attention for book
Attention for Chapter 7: Optical Metrology—On the Inspection of Ultra-Precise FEL-Optics
Altmetric Badge

Citations

dimensions_citation
19 Dimensions

Readers on

mendeley
1 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Optical Metrology—On the Inspection of Ultra-Precise FEL-Optics
Chapter number 7
Book title
Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources
Published by
Springer, Berlin, Heidelberg, January 2015
DOI 10.1007/978-3-662-47443-3_7
Book ISBNs
978-3-66-247442-6, 978-3-66-247443-3
Authors

Frank Siewert

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 1 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 1 100%
Readers by discipline Count As %
Physics and Astronomy 1 100%