You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Mendeley readers
| Chapter title |
Path Delay Fault Model
|
|---|---|
| Chapter number | 8 |
| Book title |
High Quality Test Pattern Generation and Boolean Satisfiability
|
| Published by |
Springer, Boston, MA, January 2012
|
| DOI | 10.1007/978-1-4419-9976-4_8 |
| Book ISBNs |
978-1-4419-9975-7, 978-1-4419-9976-4
|
| Authors |
Stephan Eggersglüß, Rolf Drechsler |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 1 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 1 | 100% |
| Readers by discipline | Count | As % |
|---|---|---|
| Psychology | 1 | 100% |