You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Error Detection Using Counting Technique in Low-Power VLSI
|
---|---|
Chapter number | 42 |
Book title |
Immunological Tolerance
|
Published by |
Springer, Singapore, January 2019
|
DOI | 10.1007/978-981-13-3600-3_42 |
Book ISBNs |
978-1-4939-8936-2, 978-1-4939-8938-6, 978-9-81-133599-0, 978-9-81-133600-3
|
Authors |
Kumud Kumar Bhardwaj, T. Swapna Rani |