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Measurement Techniques and Practices of Colloid and Interface Phenomena

Overview of attention for book
Attention for Chapter 8: Atomic Force Microscope (AFM)
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Citations

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Readers on

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130 Mendeley
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Chapter title
Atomic Force Microscope (AFM)
Chapter number 8
Book title
Measurement Techniques and Practices of Colloid and Interface Phenomena
Published by
Springer, Singapore, January 2019
DOI 10.1007/978-981-13-5931-6_8
Book ISBNs
978-9-81-135930-9, 978-9-81-135931-6
Authors

Kenichi Sakai, Sakai, Kenichi

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 130 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Poland 1 <1%
Unknown 129 99%

Demographic breakdown

Readers by professional status Count As %
Student > Master 23 18%
Student > Ph. D. Student 20 15%
Student > Bachelor 11 8%
Researcher 11 8%
Student > Doctoral Student 8 6%
Other 10 8%
Unknown 47 36%
Readers by discipline Count As %
Engineering 17 13%
Physics and Astronomy 13 10%
Biochemistry, Genetics and Molecular Biology 12 9%
Materials Science 12 9%
Chemistry 9 7%
Other 16 12%
Unknown 51 39%