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Test and Diagnosis for Small-Delay Defects

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Attention for Chapter 8: Maximizing Power Supply Noise on Critical Paths
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Chapter title
Maximizing Power Supply Noise on Critical Paths
Chapter number 8
Book title
Test and Diagnosis for Small-Delay Defects
Published by
Springer, New York, NY, January 2011
DOI 10.1007/978-1-4419-8297-1_8
Book ISBNs
978-1-4419-8296-4, 978-1-4419-8297-1
Authors

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty, Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu