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Chapter title |
Main Parasitic Effects in Contactless Wafer Testing
|
---|---|
Chapter number | 9 |
Book title |
Applications in Electronics Pervading Industry, Environment and Society
|
Published by |
Springer, Cham, September 2018
|
DOI | 10.1007/978-3-030-11973-7_9 |
Book ISBNs |
978-3-03-011972-0, 978-3-03-011973-7
|
Authors |
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano |