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Fully CMOS-compatible top-down fabrication of sub-50nm silicon nanowire sensing devices

Overview of attention for article published in Microelectronic Engineering, April 2014
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About this Attention Score

  • Above-average Attention Score compared to outputs of the same age (58th percentile)
  • Good Attention Score compared to outputs of the same age and source (71st percentile)

Mentioned by

patent
2 patents

Citations

dimensions_citation
7 Dimensions

Readers on

mendeley
43 Mendeley
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Title
Fully CMOS-compatible top-down fabrication of sub-50nm silicon nanowire sensing devices
Published in
Microelectronic Engineering, April 2014
DOI 10.1016/j.mee.2013.12.031
Authors

Yordan M. Georgiev, Nikolay Petkov, Brendan McCarthy, Ran Yu, Vladimir Djara, Dan O’Connell, Olan Lotty, Adrian M. Nightingale, Nuchutha Thamsumet, John C. deMello, Alan Blake, Samaresh Das, Justin D. Holmes

Mendeley readers

The data shown below were compiled from readership statistics for 43 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Malaysia 1 2%
Unknown 42 98%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 15 35%
Student > Master 7 16%
Researcher 5 12%
Professor 2 5%
Student > Bachelor 2 5%
Other 7 16%
Unknown 5 12%
Readers by discipline Count As %
Engineering 22 51%
Chemistry 4 9%
Materials Science 4 9%
Physics and Astronomy 3 7%
Agricultural and Biological Sciences 1 2%
Other 0 0%
Unknown 9 21%

Attention Score in Context

This research output has an Altmetric Attention Score of 3. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 20 August 2019.
All research outputs
#5,612,371
of 17,373,814 outputs
Outputs from Microelectronic Engineering
#347
of 1,729 outputs
Outputs of similar age
#107,722
of 274,273 outputs
Outputs of similar age from Microelectronic Engineering
#3
of 7 outputs
Altmetric has tracked 17,373,814 research outputs across all sources so far. This one is in the 47th percentile – i.e., 47% of other outputs scored the same or lower than it.
So far Altmetric has tracked 1,729 research outputs from this source. They receive a mean Attention Score of 3.5. This one is in the 9th percentile – i.e., 9% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 274,273 tracked outputs that were published within six weeks on either side of this one in any source. This one has gotten more attention than average, scoring higher than 58% of its contemporaries.
We're also able to compare this research output to 7 others from the same source and published within six weeks on either side of this one. This one has scored higher than 4 of them.