Title |
Yttrium Iron Garnet Thin Films with Very Low Damping Obtained by Recrystallization of Amorphous Material
|
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Published in |
Scientific Reports, February 2016
|
DOI | 10.1038/srep20827 |
Pubmed ID | |
Authors |
Christoph Hauser, Tim Richter, Nico Homonnay, Christian Eisenschmidt, Mohammad Qaid, Hakan Deniz, Dietrich Hesse, Maciej Sawicki, Stefan G. Ebbinghaus, Georg Schmidt |
Abstract |
We have investigated recrystallization of amorphous Yttrium Iron Garnet (YIG) by annealing in oxygen atmosphere. Our findings show that well below the melting temperature the material transforms into a fully epitaxial layer with exceptional quality, both structural and magnetic. In ferromagnetic resonance (FMR) ultra low damping and extremely narrow linewidth can be observed. For a 56 nm thick layer a damping constant of α = (6.15 ± 1.50) · 10(-5) is found and the linewidth at 9.6 GHz is as small as 1.30 ± 0.05 Oe which are the lowest values for PLD grown thin films reported so far. Even for a 20 nm thick layer a damping constant of α = (7.35 ± 1.40) · 10(-5) is found which is the lowest value for ultrathin films published so far. The FMR linewidth in this case is 3.49 ± 0.10 Oe at 9.6 GHz. Our results not only present a method of depositing thin film YIG of unprecedented quality but also open up new options for the fabrication of thin film complex oxides or even other crystalline materials. |
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