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Chapter title |
The Main Damage Characteristics of Semiconductor Devices Under High-Power Microwave
|
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Chapter number | 67 |
Book title |
Communications, Signal Processing, and Systems
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Published by |
Springer, Singapore, July 2018
|
DOI | 10.1007/978-981-13-6508-9_67 |
Book ISBNs |
978-9-81-136507-2, 978-9-81-136508-9
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Authors |
Kaibai Chen, Chen, Kaibai |