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Chapter title |
Lattice Metric Space Application to Grain Defect Detection
|
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Chapter number | 30 |
Book title |
Scale Space and Variational Methods in Computer Vision
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Published by |
Springer, Cham, June 2019
|
DOI | 10.1007/978-3-030-22368-7_30 |
Book ISBNs |
978-3-03-022367-0, 978-3-03-022368-7
|
Authors |
Yuchen He, Sung Ha Kang, He, Yuchen, Kang, Sung Ha |