You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Mendeley readers
Chapter title |
Stress Profile Analysis in n-FinFET Devices
|
---|---|
Chapter number | 29 |
Book title |
Emerging Technology in Modelling and Graphics
|
Published by |
Springer, Singapore, January 2020
|
DOI | 10.1007/978-981-13-7403-6_29 |
Book ISBNs |
978-9-81-137402-9, 978-9-81-137403-6
|
Authors |
T. P. Dash, S. Das, S. Dey, J. Jena, C. K. Maiti |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Professor > Associate Professor | 1 | 50% |
Unknown | 1 | 50% |
Readers by discipline | Count | As % |
---|---|---|
Arts and Humanities | 1 | 50% |
Engineering | 1 | 50% |