↓ Skip to main content

Electrically active interface defects in the In0.53Ga0.47As MOS system

Overview of attention for article published in Microelectronic Engineering, September 2013
Altmetric Badge

About this Attention Score

  • Average Attention Score compared to outputs of the same age

Mentioned by

twitter
2 X users

Citations

dimensions_citation
24 Dimensions

Readers on

mendeley
23 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
Electrically active interface defects in the In0.53Ga0.47As MOS system
Published in
Microelectronic Engineering, September 2013
DOI 10.1016/j.mee.2013.03.026
Authors

V. Djara, T.P. O’Regan, K. Cherkaoui, M. Schmidt, S. Monaghan, É. O’Connor, I.M. Povey, D. O’Connell, M.E. Pemble, P.K. Hurley

X Demographics

X Demographics

The data shown below were collected from the profiles of 2 X users who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 23 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 23 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 10 43%
Researcher 4 17%
Student > Master 3 13%
Professor 1 4%
Student > Bachelor 1 4%
Other 0 0%
Unknown 4 17%
Readers by discipline Count As %
Engineering 10 43%
Physics and Astronomy 4 17%
Materials Science 3 13%
Chemistry 2 9%
Unknown 4 17%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 2. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 20 February 2020.
All research outputs
#15,169,949
of 25,374,917 outputs
Outputs from Microelectronic Engineering
#1,822
of 2,002 outputs
Outputs of similar age
#115,926
of 212,478 outputs
Outputs of similar age from Microelectronic Engineering
#26
of 32 outputs
Altmetric has tracked 25,374,917 research outputs across all sources so far. This one is in the 38th percentile – i.e., 38% of other outputs scored the same or lower than it.
So far Altmetric has tracked 2,002 research outputs from this source. They receive a mean Attention Score of 3.8. This one is in the 8th percentile – i.e., 8% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 212,478 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 44th percentile – i.e., 44% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 32 others from the same source and published within six weeks on either side of this one. This one is in the 18th percentile – i.e., 18% of its contemporaries scored the same or lower than it.