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Nanoscale Redox Reaction at Metal/Oxide Interface

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Cover of 'Nanoscale Redox Reaction at Metal/Oxide Interface'

Table of Contents

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    Book Overview
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    Chapter 1 General Introduction
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    Chapter 2 Changes in Schottky Barrier Height Behavior of Pt–Ru Alloy Contacts on Single-Crystal ZnO
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    Chapter 3 Surface Passivation Effect on Schottky Contact Formation of Oxide Semiconductors
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    Chapter 4 Bias-Induced Interfacial Redox Reaction in Oxide-Based Resistive Random-Access Memory Structure
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    Chapter 5 Switching Control of Oxide-Based Resistive Random-Access Memory by Valence State Control of Oxide
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    Chapter 6 Combinatorial Thin-Film Synthesis for New Nanoelectronics Materials
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    Chapter 7 General Summary
Attention for Chapter 2: Changes in Schottky Barrier Height Behavior of Pt–Ru Alloy Contacts on Single-Crystal ZnO
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Summary
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Chapter title
Changes in Schottky Barrier Height Behavior of Pt–Ru Alloy Contacts on Single-Crystal ZnO
Chapter number 2
Book title
Nanoscale Redox Reaction at Metal/Oxide Interface
Published by
Springer, Tokyo, January 2020
DOI 10.1007/978-4-431-54850-8_2
Book ISBNs
978-4-43-154849-2, 978-4-43-154850-8
Authors

Takahiro Nagata

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