Repeated radiation damage and thermal annealing of avalanche photodiodes

Overview of attention for article published in EPJ Quantum Technology , May 2021

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In the top 5% of all research outputs scored by Altmetric
One of the highest-scoring outputs from this source (#2 of 152)
High Attention Score compared to outputs of the same age (97th percentile)
High Attention Score compared to outputs of the same age and source (87th percentile)

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[2007.04902] Ian DSouza, Jean-Philippe Bourgoin, Brendon L. Higgins et al.: Repeated radiation damage and thermal annealing of avalanche photodiodes https://t.co/Gm4uUOI0LK https://t.co/szsn4T59W3 #physics_ins_det

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