Altmetric Explorer

Journal of Intelligent Manufacturing: Highest Scoring Articles in Altmetric

Top 5 research outputs

Below is a list of the top 5 research outputs in this report. Each research output has an Altmetric Attention Score , which provides an indicator of the amount of attention that has been received.

Rank Attention Score Research output
#1

Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks

Article in Journal of Intelligent Manufacturing, January 2022
#2

Image-based defect detection in lithium-ion battery electrode using convolutional neural networks

Article in Journal of Intelligent Manufacturing, August 2019
#3

Digital modeling-driven chatter suppression for thin-walled part manufacturing

Article in Journal of Intelligent Manufacturing, November 2022
#4

Automated defect inspection of LED chip using deep convolutional neural network

Article in Journal of Intelligent Manufacturing, March 2018
#5

Reconfigurable manufacturing systems: Key to future manufacturing

Article in Journal of Intelligent Manufacturing, August 2000

Attention source breakdown

The number of mentions from each source that Altmetric has tracked for the research outputs in this report.

News mentions
9
Policy mentions
5
Patent mentions
353
Peer review mentions
7
Wikipedia mentions
28
Google+ mentions
4
The information in this report was last updated at 00:00AM UTC on 2024-04-27.
This report was produced by the Altmetric Explorer. For more information about Altmetric, visit www.altmetric.com.