Creating two-dimensional layered Zintl phase by dimensional manipulation of the crystal structure
Phys.org,
The discovery of new families of two-dimensional (2-D) layered materials beyond graphene has always attracted great attention…
Failure Analysis of Integrated Circuits
Overview of attention for book
Table of Contents
-
Altmetric BadgeBook Overview
-
Altmetric BadgeChapter 1 Introduction
-
Altmetric BadgeChapter 2 Electrical Characterization
-
Altmetric BadgeChapter 3 Package Analysis: SAM and X-ray
-
Altmetric BadgeChapter 4 Die Exposure
-
Altmetric BadgeChapter 5 Global Failure Site Isolation: Thermal Techniques
-
Altmetric BadgeChapter 6 Failure Site Isolation: Photon Emission Microscopy Optical/Electron Beam Techniques
-
Altmetric BadgeChapter 7 Probing Technology for IC Diagnosis
-
Altmetric BadgeChapter 8 IC Deprocessing
-
Altmetric BadgeChapter 9 Cross-Section Analysis
-
Altmetric BadgeChapter 10 Inspection Techniques
-
Altmetric BadgeChapter 11 Chemical Analysis
-
Altmetric BadgeChapter 12 Energy Dispersive Spectroscopy
-
Altmetric BadgeChapter 13 Auger Electron Spectroscopy
-
Altmetric BadgeChapter 14 Secondary Ion Mass Spectrometry, SIMS
-
Altmetric BadgeChapter 15 FA Future Requirements