You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Mendeley readers
Chapter title |
Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation
|
---|---|
Chapter number | 17 |
Book title |
VLSI-SoC: Research Trends in VLSI and Systems on Chip
|
Published by |
Springer, Boston, MA, January 2008
|
DOI | 10.1007/978-0-387-74909-9_17 |
Book ISBNs |
978-0-387-74908-2, 978-0-387-74909-9
|
Authors |
Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara, Iwagaki, Tsuyoshi, Ohtake, Satoshi, Fujiwara, Hideo |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 50% |
Student > Master | 1 | 50% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 1 | 50% |
Engineering | 1 | 50% |