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Chapter title |
Source-End Layouts on ESD/LU Reliabilities in an HV 0.25 um 60 V nLDMOS
|
---|---|
Chapter number | 60 |
Book title |
Intelligent Technologies and Engineering Systems
|
Published by |
Springer, New York, NY, January 2013
|
DOI | 10.1007/978-1-4614-6747-2_60 |
Book ISBNs |
978-1-4614-6746-5, 978-1-4614-6747-2
|
Authors |
Shen-Li Chen, Min-Hua Lee, Tzung-Shian Wu, Yi-Sheng Lai, Chun-Ju Lin, Hsun-Hsiang Chen, Chen, Shen-Li, Lee, Min-Hua, Wu, Tzung-Shian, Lai, Yi-Sheng, Lin, Chun-Ju, Chen, Hsun-Hsiang |