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Chapter title |
Energetics and Scanning Tunneling Microscopy Images of B and N Defects in Graphene Bilayer
|
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Chapter number | 13 |
Book title |
3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM)
|
Published in |
ADS, January 2017
|
DOI | 10.1007/978-3-319-46601-9_13 |
Book ISBNs |
978-3-31-946600-2, 978-3-31-946601-9
|
Authors |
Yoshitaka Fujimoto, Susumu Saito |