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Chapter title |
A Comparison Analysis of Single-Ended Bit-Line Leakage Reduction Techniques at 40 nm Node
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Chapter number | 193 |
Book title |
Unifying Electrical Engineering and Electronics Engineering
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Published by |
Springer, New York, NY, January 2014
|
DOI | 10.1007/978-1-4614-4981-2_193 |
Book ISBNs |
978-1-4614-4980-5, 978-1-4614-4981-2
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Authors |
Liang Wen, Zhentao Li, Yong Li |