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Chapter title |
The Methodology of Monitoring MOA Insulation Defects Based on Transient Voltage and Current
|
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Chapter number | 26 |
Book title |
Unifying Electrical Engineering and Electronics Engineering
|
Published by |
Springer, New York, NY, January 2014
|
DOI | 10.1007/978-1-4614-4981-2_26 |
Book ISBNs |
978-1-4614-4980-5, 978-1-4614-4981-2
|
Authors |
Yu-sheng Quan, Hui Wang, Yu-liang Wu, Bo Yi, Xiao-yang Chen |