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#Book - "Auger and X-Ray Photoelectron Spectroscopy in Materials Science" by Hofmann, Siegfried | http://t.co/hTqqjbbl | via...
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Overview of attention for book
Table of Contents
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Altmetric BadgeBook Overview
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Altmetric BadgeChapter 1 Introduction and Outline
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Altmetric BadgeChapter 2 Instrumentation
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Altmetric BadgeChapter 3 Qualitative Analysis (Principle and Spectral Interpretation)
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Altmetric BadgeChapter 4 Quantitative Analysis (Data Evaluation)
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Altmetric BadgeChapter 5 Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness
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Altmetric BadgeChapter 6 Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio
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Altmetric BadgeChapter 7 Quantitative Compositional Depth Profiling
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Altmetric BadgeChapter 8 Practice of Surface and Interface Analysis with AES and XPS
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Altmetric BadgeChapter 9 Typical Applications of AES and XPS
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Altmetric BadgeChapter 10 Surface Analysis Techniques Related to AES and XPS