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| Chapter title |
BTI Analysis Tool (BAT) Model Framework—Interface Trap Occupancy and Hole Trapping
|
|---|---|
| Chapter number | 5 |
| Book title |
Recent Advances in PMOS Negative Bias Temperature Instability
|
| Published by |
Springer, Singapore, November 2021
|
| DOI | 10.1007/978-981-16-6120-4_5 |
| Book ISBNs |
978-9-81-166119-8, 978-9-81-166120-4
|
| Authors |
Mahapatra, Souvik, Parihar, Narendra, Choudhury, Nilotpal, Goel, Nilesh |