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Recent Advances in PMOS Negative Bias Temperature Instability

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Attention for Chapter 2: Device Architecture, Material and Process Dependencies of NBTI Parametric Drift
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Chapter title
Device Architecture, Material and Process Dependencies of NBTI Parametric Drift
Chapter number 2
Book title
Recent Advances in PMOS Negative Bias Temperature Instability
Published by
Springer, Singapore, November 2021
DOI 10.1007/978-981-16-6120-4_2
Book ISBNs
978-9-81-166119-8, 978-9-81-166120-4
Authors

Mahapatra, Souvik, Parihar, Narendra