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| Chapter title |
Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors
|
|---|---|
| Chapter number | 3 |
| Book title |
VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability
|
| Published by |
Springer, Cham, September 2016
|
| DOI | 10.1007/978-3-319-67104-8_3 |
| Book ISBNs |
978-3-31-967103-1, 978-3-31-967104-8
|
| Authors |
Maedeh Hemmat, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram, Hemmat, Maedeh, Kamal, Mehdi, Afzali-Kusha, Ali, Pedram, Massoud |