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VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability

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Attention for Chapter 3: Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors
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Chapter title
Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors
Chapter number 3
Book title
VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability
Published by
Springer, Cham, September 2016
DOI 10.1007/978-3-319-67104-8_3
Book ISBNs
978-3-31-967103-1, 978-3-31-967104-8
Authors

Maedeh Hemmat, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram