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Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors
VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability
Springer, Cham, September 2016
Maedeh Hemmat, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram