Maedeh Hemmat, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram. Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors. Thomas Hollstein; Jaan Raik; Sergei Kostin; Anton Tšertov; Ian O'Connor; Ricardo Reis. 24th IFIP/IEEE Inter
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Maedeh Hemmat, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram. Robust Hybrid TFET-MOSFET Circuits in Presence of Process…