Contactless VLSI Measurement and Testing Techniques

Overview of attention for book

Cover of 'Contactless VLSI Measurement and Testing Techniques'

Table of Contents

Attention for Chapter 1: Conventional Test Methods

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Citations

dimensions_citation: 3 Dimensions

Summary Dimensions citations

So far, Dimensions has found 3 publications that cite this research output.

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The most recent citing publications are shown below. View all 3 publications that cite this research output on Dimensions.

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures

Article in Journal of Electronic Testing (February 2020)

Development of a Measurement System-on-Chip and Simulation on FPGA

Conference proceeding (January 2020)

Development of a High-Speed Multi-Target Measurement System-on-Chip

Conference proceeding (January 2019)

This page shows the most recent citations of this research output.

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