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Mendeley readers
Chapter title |
Conductive AFM for Nanoscale Analysis of High-k Dielectric Metal Oxides
|
---|---|
Chapter number | 2 |
Book title |
Electrical Atomic Force Microscopy for Nanoelectronics
|
Published by |
Springer, Cham, January 2019
|
DOI | 10.1007/978-3-030-15612-1_2 |
Book ISBNs |
978-3-03-015611-4, 978-3-03-015612-1
|
Authors |
Christian Rodenbücher, Marcin Wojtyniak, Kristof Szot, Rodenbücher, Christian, Wojtyniak, Marcin, Szot, Kristof |
Mendeley readers
The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 10 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Lecturer > Senior Lecturer | 2 | 20% |
Researcher | 2 | 20% |
Student > Ph. D. Student | 2 | 20% |
Student > Bachelor | 1 | 10% |
Professor | 1 | 10% |
Other | 0 | 0% |
Unknown | 2 | 20% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 3 | 30% |
Engineering | 2 | 20% |
Materials Science | 2 | 20% |
Biochemistry, Genetics and Molecular Biology | 1 | 10% |
Chemical Engineering | 1 | 10% |
Other | 0 | 0% |
Unknown | 1 | 10% |