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Mendeley readers
| Chapter title |
Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures
|
|---|---|
| Chapter number | 3 |
| Book title |
Electrical Atomic Force Microscopy for Nanoelectronics
|
| Published by |
Springer, Cham, January 2019
|
| DOI | 10.1007/978-3-030-15612-1_3 |
| Book ISBNs |
978-3-03-015611-4, 978-3-03-015612-1
|
| Authors |
Andreas Schulze, Pierre Eyben, Jay Mody, Kristof Paredis, Lennaert Wouters, Umberto Celano, Wilfried Vandervorst, Schulze, Andreas, Eyben, Pierre, Mody, Jay, Paredis, Kristof, Wouters, Lennaert, Celano, Umberto, Vandervorst, Wilfried |
Mendeley readers
The data shown below were compiled from readership statistics for 9 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 9 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 3 | 33% |
| Student > Doctoral Student | 1 | 11% |
| Other | 1 | 11% |
| Student > Master | 1 | 11% |
| Unknown | 3 | 33% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 2 | 22% |
| Materials Science | 2 | 22% |
| Engineering | 2 | 22% |
| Unknown | 3 | 33% |