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Mendeley readers
| Chapter title |
The Atomic Force Microscopy for Nanoelectronics
|
|---|---|
| Chapter number | 1 |
| Book title |
Electrical Atomic Force Microscopy for Nanoelectronics
|
| Published by |
Springer, Cham, January 2019
|
| DOI | 10.1007/978-3-030-15612-1_1 |
| Book ISBNs |
978-3-03-015611-4, 978-3-03-015612-1
|
| Authors |
Umberto Celano, Celano, Umberto |
Mendeley readers
The data shown below were compiled from readership statistics for 75 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 75 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 19 | 25% |
| Student > Master | 10 | 13% |
| Researcher | 9 | 12% |
| Student > Bachelor | 7 | 9% |
| Student > Doctoral Student | 6 | 8% |
| Other | 8 | 11% |
| Unknown | 16 | 21% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 20 | 27% |
| Materials Science | 13 | 17% |
| Engineering | 12 | 16% |
| Chemistry | 4 | 5% |
| Chemical Engineering | 3 | 4% |
| Other | 6 | 8% |
| Unknown | 17 | 23% |