↓ Skip to main content
Altmetric
What is this page?
Embed badge
Share
Share on Twitter
Share on Facebook
Share by email
Silicon Carbide : Recent Major Advances
Overview of attention for book
Table of Contents
Altmetric Badge
Book Overview
Altmetric Badge
Chapter 1
Zero- and Two-Dimensional Native Defects
Altmetric Badge
Chapter 2
Defect Migration and Annealing Mechanisms
Altmetric Badge
Chapter 3
Hydrogen in SiC
Altmetric Badge
Chapter 4
Electronic Properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes
Altmetric Badge
Chapter 5
Principles and Limitations of Numerical Simulation of SiC Boule Growth by Sublimation
Altmetric Badge
Chapter 6
Defect Formation and Reduction During Bulk SiC Growth
Altmetric Badge
Chapter 7
High Nitrogen Doping During Bulk Growth of SiC
Altmetric Badge
Chapter 8
Homoepitaxial and Heteroepitaxial Growth on Step-Free SiC Mesas
Altmetric Badge
Chapter 9
Low-Defect 3 C -SiC Grown on Undulant-Si (001) Substrates
Altmetric Badge
Chapter 10
New Development in Hot Wall Vapor Phase Epitaxial Growth of Silicon Carbide
Altmetric Badge
Chapter 11
Formation of SiC Thin Films by Ion Beam Synthesis
Altmetric Badge
Chapter 12
Atomic Structure of SiC Surfaces
Altmetric Badge
Chapter 13
The Continuum of Interface-Induced Gap States — The Unifying Concept of the Band Lineup at Semiconductor Interfaces — Application to Silicon Carbide
Altmetric Badge
Chapter 14
Contributions to the Density of Interface States in SiC MOS Structures
Altmetric Badge
Chapter 15
Properties of Nitrided Oxides on SiC
Altmetric Badge
Chapter 16
Hall Effect Studies of Electron Mobility and Trapping at the SiC/SiO 2 Interface
Altmetric Badge
Chapter 17
Optical Properties of SiC: 1997–2002
Altmetric Badge
Chapter 18
Cyclotron Resonance Studies of Effective Masses and Band Structure in SiC
Altmetric Badge
Chapter 19
Electronic Structure of Deep Defects in SiC
Altmetric Badge
Chapter 20
Phosphorus-Related Centers in SiC
Altmetric Badge
Chapter 21
Hall Scattering Factor for Electrons and Holes in SiC
Altmetric Badge
Chapter 22
Radiotracer Deep Level Transient Spectroscopy
Altmetric Badge
Chapter 23
Vacancy Defects Detected by Positron Annihilation
Altmetric Badge
Chapter 24
Characterization of Defects in SiC Crystals by Raman Scattering
Altmetric Badge
Chapter 25
Characterization of Low-Dimensional Structures in SiC Using Advanced Transmission Electron Microscopy
Altmetric Badge
Chapter 26
Synchrotron White Beam X-Ray Topography and High Resolution X-RayDiffraction Studies of Defects in SiC Substrates, Epilayers and Device Structures
Altmetric Badge
Chapter 27
Ohmic Contacts for Power Devices on SiC
Altmetric Badge
Chapter 28
Micromachining of SiC
Altmetric Badge
Chapter 29
Surface Preparation Techniques for SiC Wafers
Altmetric Badge
Chapter 30
Epitaxial Growth and Device Processing of SiC on Non-Basal Planes
Altmetric Badge
Chapter 31
SiC Power Bipolar Transistors and Thyristors
Altmetric Badge
Chapter 32
High Voltage SiC Devices
Altmetric Badge
Chapter 33
Power MOSFETs in 4 H -SiC: Device Design and Technology
Altmetric Badge
Chapter 34
Normally-Off Accumulation-Mode Epi-Channel Field Effect Transistor
Altmetric Badge
Chapter 35
Development of SiC Devices for Microwave and RF Power Amplifiers
Altmetric Badge
Chapter 36
Advances in SiC Field Effect Gas Sensors
Overall attention for this book and its chapters
Altmetric Badge
Mentioned by
twitter
1
X user
syllabi
1
institution with syllabi
patent
1
patent
Citations
dimensions_citation
258
Dimensions
Readers on
mendeley
62
Mendeley
Book overview
1. Zero- and Two-Dimensional Native Defects
2. Defect Migration and Annealing Mechanisms
3. Hydrogen in SiC
4. Electronic Properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes
5. Principles and Limitations of Numerical Simulation of SiC Boule Growth by Sublimation
6. Defect Formation and Reduction During Bulk SiC Growth
7. High Nitrogen Doping During Bulk Growth of SiC
8. Homoepitaxial and Heteroepitaxial Growth on Step-Free SiC Mesas
9. Low-Defect 3 C -SiC Grown on Undulant-Si (001) Substrates
10. New Development in Hot Wall Vapor Phase Epitaxial Growth of Silicon Carbide
11. Formation of SiC Thin Films by Ion Beam Synthesis
12. Atomic Structure of SiC Surfaces
13. The Continuum of Interface-Induced Gap States — The Unifying Concept of the Band Lineup at Semiconductor Interfaces — Application to Silicon Carbide
14. Contributions to the Density of Interface States in SiC MOS Structures
15. Properties of Nitrided Oxides on SiC
16. Hall Effect Studies of Electron Mobility and Trapping at the SiC/SiO 2 Interface
17. Optical Properties of SiC: 1997–2002
18. Cyclotron Resonance Studies of Effective Masses and Band Structure in SiC
19. Electronic Structure of Deep Defects in SiC
20. Phosphorus-Related Centers in SiC
21. Hall Scattering Factor for Electrons and Holes in SiC
22. Radiotracer Deep Level Transient Spectroscopy
23. Vacancy Defects Detected by Positron Annihilation
24. Characterization of Defects in SiC Crystals by Raman Scattering
25. Characterization of Low-Dimensional Structures in SiC Using Advanced Transmission Electron Microscopy
26. Synchrotron White Beam X-Ray Topography and High Resolution X-RayDiffraction Studies of Defects in SiC Substrates, Epilayers and Device Structures
27. Ohmic Contacts for Power Devices on SiC
28. Micromachining of SiC
29. Surface Preparation Techniques for SiC Wafers
30. Epitaxial Growth and Device Processing of SiC on Non-Basal Planes
31. SiC Power Bipolar Transistors and Thyristors
32. High Voltage SiC Devices
33. Power MOSFETs in 4 H -SiC: Device Design and Technology
34. Normally-Off Accumulation-Mode Epi-Channel Field Effect Transistor
35. Development of SiC Devices for Microwave and RF Power Amplifiers
36. Advances in SiC Field Effect Gas Sensors
Summary
X
Syllabi
Patents
Dimensions citations
This data is correct as of December 2015 - for more up to date information, please visit
https://opensyllabus.org/
So far, Altmetric has seen this research output assigned in
1
syllabus from an institution on Open Syllabus Project.
Institution
Syllabi count
Course subject areas covered
Unknown
1
Business, Engineering, Biology, History, Law