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Chapter title |
Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
|
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Chapter number | 20 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI | 10.1007/978-3-540-85156-1_20 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
P. D. Nellist, E. C. Cosgriff, G. Behan, A. I. Kirkland, A. J. D’Alfonso, S. D. Findlay, L. J. Allen, Nellist, P. D., Cosgriff, E. C., Behan, G., Kirkland, A. I., D’Alfonso, A. J., Findlay, S. D., Allen, L. J. |