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Chapter title |
Structural Investigation of Amorphous/Crystalline Interfaces by Iterative Digital Image Series Matching
|
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Chapter number | 78 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
|
Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI | 10.1007/978-3-540-85156-1_78 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
K. Thiel, N. I. Borgardt, T. Niermann, M. Seibt |