Attention for Chapter 77:
Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductors
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Chapter title |
Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductors
|
Chapter number |
77 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
|
Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI |
10.1007/978-3-540-85156-1_77 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
M. Schowalter, A. Rosenauer, J. T. Titantah, D. Lamoen
|
Mendeley readers
Mendeley readers
Geographical breakdown
Country |
Count |
As % |
Unknown |
3 |
100% |
Demographic breakdown
Readers by professional status |
Count |
As % |
Student > Ph. D. Student |
1 |
33% |
Researcher |
1 |
33% |
Student > Master |
1 |
33% |
Readers by discipline |
Count |
As % |
Materials Science |
1 |
33% |
Engineering |
1 |
33% |
Unknown |
1 |
33% |