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Mendeley readers
Chapter title |
A Study of Stacked Si Nanowire Devices by Electron Tomography
|
---|---|
Chapter number | 152 |
Book title |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI | 10.1007/978-3-540-85156-1_152 |
Book ISBNs |
978-3-54-085154-7, 978-3-54-085156-1
|
Authors |
P. D. Cherns, C. Dupré, D. Cooper, F. Aussenac, A. Chabli, T. Ernst |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 50% |
Student > Master | 1 | 50% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 1 | 50% |
Engineering | 1 | 50% |