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Scanning Microscopy for Nanotechnology

Overview of attention for book
Attention for Chapter 6: Scanning Transmission Electron Microscopy for Nanostructure Characterization
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Mentioned by

patent
1 patent

Citations

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170 Dimensions

Readers on

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186 Mendeley
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Chapter title
Scanning Transmission Electron Microscopy for Nanostructure Characterization
Chapter number 6
Book title
Scanning Microscopy for Nanotechnology
Published by
Springer, New York, NY, January 2006
DOI 10.1007/978-0-387-39620-0_6
Book ISBNs
978-0-387-33325-0, 978-0-387-39620-0
Authors

S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. P. Oxley, K. Van Benthem, M. F. Chisholm, Pennycook, S. J., Lupini, A. R., Varela, M., Borisevich, A., Peng, Y., Oxley, M. P., Benthem, K. Van, Chisholm, M. F., Van Benthem, K.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 186 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Belgium 2 1%
Germany 1 <1%
Switzerland 1 <1%
Mexico 1 <1%
United Kingdom 1 <1%
China 1 <1%
United States 1 <1%
Unknown 178 96%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 50 27%
Researcher 26 14%
Student > Master 24 13%
Student > Bachelor 19 10%
Student > Doctoral Student 13 7%
Other 27 15%
Unknown 27 15%
Readers by discipline Count As %
Materials Science 42 23%
Engineering 28 15%
Physics and Astronomy 26 14%
Chemistry 22 12%
Agricultural and Biological Sciences 6 3%
Other 21 11%
Unknown 41 22%