↓ Skip to main content

Scanning Microscopy for Nanotechnology

Overview of attention for book
Attention for Chapter 2: Backscattering Detector and EBSD in Nanomaterials Characterization
Altmetric Badge

Mentioned by

wikipedia
3 Wikipedia pages

Citations

dimensions_citation
173 Dimensions

Readers on

mendeley
211 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Backscattering Detector and EBSD in Nanomaterials Characterization
Chapter number 2
Book title
Scanning Microscopy for Nanotechnology
Published by
Springer, New York, NY, January 2006
DOI 10.1007/978-0-387-39620-0_2
Book ISBNs
978-0-387-33325-0, 978-0-387-39620-0
Authors

Tim Maitland, Scott Sitzman, Maitland, Tim, Sitzman, Scott

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 211 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Russia 1 <1%
Germany 1 <1%
Unknown 209 99%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 19 9%
Student > Master 8 4%
Researcher 8 4%
Student > Doctoral Student 6 3%
Other 4 2%
Other 6 3%
Unknown 160 76%
Readers by discipline Count As %
Materials Science 17 8%
Engineering 10 5%
Physics and Astronomy 9 4%
Earth and Planetary Sciences 2 <1%
Chemistry 2 <1%
Other 6 3%
Unknown 165 78%