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Mendeley readers
| Chapter title |
Trends in 3D Integrated Circuit (3D-IC) Testing Technology
|
|---|---|
| Chapter number | 8 |
| Book title |
Three-Dimensional Integration of Semiconductors
|
| Published by |
Springer, Cham, January 2015
|
| DOI | 10.1007/978-3-319-18675-7_8 |
| Book ISBNs |
978-3-31-918674-0, 978-3-31-918675-7
|
| Authors |
Hiroshi Takahashi, Senling Wang, Shuichi Kameyama, Yoshinobu Higami, Hiroyuki Yotsuyanagi, Masaki Hashizume, Shyue-Kung Lu, Zvi Roth |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 1 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Professor > Associate Professor | 1 | 100% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 1 | 100% |