Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
Springer, Berlin, Heidelberg
| Chapter title |
Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives
|
|---|---|
| Chapter number | 55 |
| Book title |
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
|
| Published by |
Springer, Berlin, Heidelberg, September 2005
|
| DOI | 10.1007/11556930_55 |
| Book ISBNs |
978-3-54-029013-1, 978-3-54-032080-7
|
| Authors |
Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault, Badereddine, Nabil, Girard, Patrick, Virazel, Arnaud, Pravossoudovitch, Serge, Landrault, Christian |
| Country | Count | As % |
|---|---|---|
| Unknown | 3 | 100% |
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Doctoral Student | 1 | 33% |
| Student > Master | 1 | 33% |
| Unknown | 1 | 33% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 1 | 33% |
| Engineering | 1 | 33% |
| Unknown | 1 | 33% |