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Mendeley readers
| Chapter title |
Topochemical Analysis of Cell Wall Components by TOF-SIMS.
|
|---|---|
| Chapter number | 18 |
| Book title |
Xylem
|
| Published in |
Methods in molecular biology, January 2017
|
| DOI | 10.1007/978-1-4939-6722-3_18 |
| Pubmed ID | |
| Book ISBNs |
978-1-4939-6720-9, 978-1-4939-6722-3
|
| Authors |
Dan Aoki, Kazuhiko Fukushima |
| Editors |
Miguel de Lucas, J. Peter Etchhells |
| Abstract |
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a recently developing analytical tool and a type of imaging mass spectrometry. TOF-SIMS provides mass spectral information with a lateral resolution on the order of submicrons, with widespread applicability. Sometimes, it is described as a surface analysis method without the requirement for sample pretreatment; however, several points need to be taken into account for the complete utilization of the capabilities of TOF-SIMS. In this chapter, we introduce methods for TOF-SIMS sample treatments, as well as basic knowledge of wood samples TOF-SIMS spectral and image data analysis. |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 3 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Postgraduate | 1 | 33% |
| Student > Doctoral Student | 1 | 33% |
| Student > Ph. D. Student | 1 | 33% |
| Readers by discipline | Count | As % |
|---|---|---|
| Biochemistry, Genetics and Molecular Biology | 1 | 33% |
| Agricultural and Biological Sciences | 1 | 33% |
| Materials Science | 1 | 33% |