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Mendeley readers
Chapter title |
Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models
|
---|---|
Chapter number | 47 |
Book title |
VLSI Design and Test
|
Published by |
Springer, Singapore, July 2019
|
DOI | 10.1007/978-981-32-9767-8_47 |
Book ISBNs |
978-9-81-329766-1, 978-9-81-329767-8
|
Authors |
Deepthi Amuru, Andleeb Zahra, Zia Abbas, Amuru, Deepthi, Zahra, Andleeb, Abbas, Zia |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Professor > Associate Professor | 2 | 67% |
Researcher | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 1 | 33% |
Chemistry | 1 | 33% |
Engineering | 1 | 33% |