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Chapter title |
From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation
|
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Chapter number | 1 |
Book title |
Hot Carrier Degradation in Semiconductor Devices
|
Published by |
Springer, Cham, January 2015
|
DOI | 10.1007/978-3-319-08994-2_1 |
Book ISBNs |
978-3-31-908993-5, 978-3-31-908994-2
|
Authors |
William McMahon, Yoann Mamy-Randriamihaja, Balaji Vaidyanathan, Tanya Nigam, Ninad Pimparkar |