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Hot Carrier Degradation in Semiconductor Devices

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Cover of 'Hot Carrier Degradation in Semiconductor Devices'

Table of Contents

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    Book Overview
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    Chapter 1 From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation
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    Chapter 2 The Energy Driven Hot Carrier Model
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    Chapter 3 Hot-Carrier Degradation in Decananometer CMOS Nodes: From an Energy-Driven to a Unified Current Degradation Modeling by a Multiple-Carrier Degradation Process
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    Chapter 4 Physics-Based Modeling of Hot-Carrier Degradation
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    Chapter 5 Semi-analytic Modeling for Hot Carriers in Electron Devices
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    Chapter 6 The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation
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    Chapter 7 Recovery from Hot Carrier Induced Degradation Through Temperature Treatment
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    Chapter 8 Characterization of MOSFET Interface States Using the Charge Pumping Technique
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    Chapter 9 Channel Hot Carriers in SiGe and Ge pMOSFETs
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    Chapter 10 Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs
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    Chapter 11 Characterization and Modeling of High-Voltage LDMOS Transistors
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    Chapter 12 Compact Modelling of the Hot-Carrier Degradation of Integrated HV MOSFETs
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    Chapter 13 Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors
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    Chapter 14 Hot-Carrier Injection Degradation in Advanced CMOS Nodes: A Bottom-Up Approach to Circuit and System Reliability
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    Chapter 15 Circuit Reliability: Hot-Carrier Stress of MOS Transistors in Different Fields of Application
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    Chapter 16 Reliability Simulation Models for Hot Carrier Degradation
Attention for Chapter 13: Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors
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Chapter title
Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors
Chapter number 13
Book title
Hot Carrier Degradation in Semiconductor Devices
Published by
Springer, Cham, January 2015
DOI 10.1007/978-3-319-08994-2_13
Book ISBNs
978-3-31-908993-5, 978-3-31-908994-2

Partha S. Chakraborty, John D. Cressler