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Chapter title |
Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs
|
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Chapter number | 10 |
Book title |
Hot Carrier Degradation in Semiconductor Devices
|
Published by |
Springer, Cham, January 2015
|
DOI | 10.1007/978-3-319-08994-2_10 |
Book ISBNs |
978-3-31-908993-5, 978-3-31-908994-2
|
Authors |
Moonju Cho, Erik Bury, Ben Kaczer, Guido Groeseneken |