Altmetric badges integrated into HeinOnline

Posted by Misha Kidambi on 12th March 2024

With the recently announced Altmetric integration into HeinOnline, a William S. Hein & Co., Inc. product, researchers can better assess online attention across news outlets, websites, blogs, social media, and other platforms such as Wikipedia and more. HeinOnline,  an online research database that provides coverage from the inception of more than 3,300 multidisciplinary periodicals, essential government documents, international treaties and trials, case law, etc., has added Altmetric, enabling a quick way to locate authoritative material in HeinOnline. 

In HeinOnline, an Altmetric badge will appear if an article includes a Digital Object Identifier, also known as a DOI, and at least one metric from an outside online source, such as public policy documents, online reference managers, social media (Facebook, X, Google+, etc.), Wikipedia, post-publication peer-review platforms, patents, etc. The Altmetric badge is designed to provide a quick and easy way of showcasing the value of a publishing program to internal and external stakeholders, such as funding institutions and editorial boards. The badges also allow users to showcase the effects of marketing and outreach activity undertaken clearly.

Altmetric badges are updated daily, and selecting the badge brings users to that article’s Altmetric Attention Score page. The summary tab contains general information regarding the paper. It also contains a visual representation of the location of users from X, formerly known as Twitter and Mendeley Reader, who share the output.

Altmetric badges can be found in four different places in HeinOnline: Search results, Author Profile Pages, Viewing an article,  MyHein account

More information can be found on the HeinOnline blog and press release.

If you want to learn more about Altmetric badges, contact the Altmetric team for a demo.